ΝΕΟ
Συγγραφέας: Dorit Hanein PhD (Editor), Niels Volkmann PhD (Editor)
Model: 9780443188299
Cryo-Electron Tomography: A Journey from Sample Preparation to Data Mining providing a holistic overview of this rapidly advancing field and equipping researchers with the knowledge and tools necessary to initiate their own investigations. The book begins with a section on advanced cryogenic sample ..
145,00€ 160,00€
Χωρίς ΦΠΑ:136,79€
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